Specifications for MP100-ME

Scanning Range: 380 nm to 950 nm, standard
Optional Range: 380 nm to 2500 nm
Spectrum Resolution: 2 nm in Visible, 4 nm in NIR
Precision: 0.3 nm
Measurement Speed: 2 sec.
Measurement Spot Size: Varies by Magnification; 60 microns at 5X magnification, 30 microns at 10X magnification, 15 microns at 20X magnification, and 7 microns at 40X magnification

For greater precision, inquire about a Custom Built Unit

Viewing Methods: 2" camcorder screen, and dual microscope eyepiece lenses can be used to view the measurement spot

Measurement Specifications

  TOP LAYER SECOND LAYER THIRD LAYER FOURTH LAYER
FILM TYPE Objective Lens Magnification RANGE std dev RANGE std dev RANGE std dev Range std dev
P1/P2/ITO/Oxide/Glass

1X, 10X

100-30,000Å

100-10,000Å

100-2000Å

100-3,000Å

Oxide/Si 1X, 10X

200-30,000Å

2Å

           
   

30,000-50,000Å

5Å

           
  40X

200-10,000Å

2Å

           
   

10,000-20,000Å

5Å

           
Nitride/Si 1X, 10X

150-20,000Å

2Å

           
  40X

150-15,000Å

2Å

           
Photoresist/Si 1X, 10X, 40X

500-20,000Å

5Å

           
Nitride/Oxide/Si 1X, 10X

150-20,000Å

5Å

100-10,000Å

5Å

       
Poly/Oxide/Si 1X, 10X

100-5,000Å

5Å

100-10,000Å

5Å

 

 

   
Oxide/Poly/Oxide/Si 1X, 10X

100-10,000Å

5Å

0-10,000Å

5Å

0-10,000Å

5Å

   
Oxide/Al 1X, 10X, 40X

2,000-20,000Å

5Å

           
Photoresist/Cr 1X, 10X, 40X

500-20,000Å

5Å

           
Oxide/NiFe 1X, 10X, 40X

2,000-20,000Å

5Å

           
Photoresist/Glass 1X, 10X, 40X

500-20,000Å

10Å

           
ITO/Oxide/Glass 1X, 10X, 40X

100-3,000Å

2Å

100-2,000Å

2Å

       
CIE Color measurement 1X                
Very Thick Film 5X

50,000-150,000Å

100Å

           
Customized film types can also be created for your applications.