MP100-ME-VIS-NIR Specifications

Scanning Range: 380 nm to 1700 nm, standard
Spectrum Resolution: 4 nm
Precision: 0.3nm
Measurement Speed: 5 sec.
Measurement Spot: 5X Objective is 200 microns, 10X Objective is 100 microns, 20X Objective is 50 microns, 40X Objective is 25 microns
Viewing Methods: 2" camcorder screen, and dual microscope eyepiece lenses can be used to view the measurement spot

Measurement Specifications

  TOP LAYER SECOND LAYER THIRD LAYER FORTH LAYER
FILM TYPE Objective Lens Magnification RANGE std dev RANGE std dev RANGE std dev RANGE std dev
P1/P2/ITO/Oxide/Glass

5X,10X

100-30000

5

100-10000

5

100-2000

5

100-3000

5

Oxide/Si

5X, 10X

200-3000 2            
    3000-50000 5            
 

40X

200-3000 2            
    150-20000 5            
Nitride/Si

5X, 10X

150-2000 2            
    2000-20000 3            
 

40X

150-2000 2            
    2000-10000 3            
Photoresist/Si

5X, 10X, 40X

500-20000 5            
Ni/Ox/Si

5X, 10X

150-20000 5     0-10000 5    
Poly/Ox/Si

5X, 10X

100-5000 5       5    
Ox/Poly/Ox/Si

5X, 10X

100-10000 5 0-5000 5 0-10000 5    
Ox/Al

5X, 10X, 40X

2000-20000 5            
Photoresist/Cr

5X, 10X, 40X

500-20000 5            
Ox/NiFe

5X, 10X, 40X

2000-10000 5            
 

5X, 10X

10000-50000 20            
 

5X

50000-150000 100            
Photoresist/Glass

5X, 10X, 40X

500-20000 10