Specifications for MP100-ME-WL

Scanning Range: 380 nm to 950 nm, standard
Spectrum Resolution: 2 nm
Precision: 0.2 nm
Measurement Speed: 2 sec.
Measurement Spot Size: 50 microns at 5X magnification

For greater precision, inquire about a Custom Built Unit

Viewing Methods: 2" camcorder screen, and dual microscope eyepiece lenses can be used to view the measurement spot

Measurement Specifications

  TOP LAYER SECOND LAYER THIRD LAYER FOURTH LAYER
FILM TYPE Objective Lens Magnification RANGE std dev RANGE std dev RANGE std dev Range std dev
P1/P2/ITO/Oxide/Glass

5X,10X

  100-30,000Å

100-10,000Å

100-2000Å

100-3,000Å

Oxide/Si 5X, 10X

200-30,000Å

2Å

           
   

30,000-50,000Å

5Å

           
  5X

200-10,000Å

2Å

           
   

10,000-20,000Å

5Å

           
Nitride/Si 5X, 10X

150-20,000Å

2Å

           
  5X

150-15,000Å

2Å

           
Photoresist/Si 5X, 10X, 5X

500-20,000Å

5Å

           
Nitride/Oxide/Si 5X, 10X

150-20,000Å

5Å

100-10,000Å

5Å

       
Poly/Oxide/Si 5X, 10X

100-5,000Å

5Å

100-10,000Å

5Å

 

 

   
Oxide/Poly/Oxide/Si 5X, 10X

100-10,000Å

5Å

0-10,000Å

5Å

0-10,000Å

5Å

   
Oxide/Al 5X, 10X, 5X

2,000-20,000Å

5Å

           
Photoresist/Cr 5X, 10X, 5X

500-20,000Å

5Å

           
Oxide/NiFe 5X, 10X, 5X

2,000-20,000Å

5Å

           
Photoresist/Glass 5X, 10X, 5X

500-20,000Å

10Å

           
ITO/Oxide/Glass 5X, 10X, 5X

100-3,000Å

2Å

100-2,000Å

2Å

       
Very Thick Film 5X

50,000-150,000Å

100Å

           
Customized film types can also be created for your applications.