Specifications for MP100-ST

Scanning Range: 380 nm to 950 nm, standard
Optional Range: 200 nm to 2500 nm
Spectrum Resolution: 2 nm in Visible 4 nm in NIR
Precision: 0.2 nm
Measurement Speed: 2 sec.
Measurement Spot: 3 to 5 mm diameter
Sample View: Not Available due to lack of Objective Lens Magnification

Measurement Specifications

  TOP LAYER SECOND LAYER THIRD LAYER FOURTH LAYER
FILM TYPE Magnification Not Available RANGE std dev RANGE std dev RANGE std dev Range std dev
P1/P2/ITO/Oxide/Glass

1X Probe

100-3,000Å

100-3,000Å

100-1,500Å

100-1,500Å

Oxide/Si

1X Probe

200-30,000Å

2Å

           
   

30,000 - 50,000Å

           
   

50,000 - 100,000Å

20Å            
Nitride/Si

1X Probe

150-20,000Å

2Å

           
Photoresist/Si

1X Probe

500-20,000Å

5Å

           
Nitride/Oxide/Si

1X Probe

150-20,000Å

5Å

1500-20,000Å 5Å

 

 

   
Poly/Oxide/Si

1X Probe

100-5,000Å

5Å

0-10,000Å 5Å        
Oxide/Poly/Oxide/Si

1X Probe

100-10,000Å

5Å

0-10,000Å 5Å

100-10,000Å

5Å

   
Oxide/Al

1X Probe

2,000-20,000Å

5Å

           
Photoresist/Cr

1X Probe

500-20,000Å

5Å

           
Oxide/NiFe

1X Probe

2,000-20,000Å

5Å

           
Photoresist/Glass

1X Probe

500-20,000Å

5Å

           

ITO/Oxide/Glass

1X Probe

100-3000Å

100 - 2000Å        
Very Thick Film

1X Probe

100,000-500,000Å

100Å

           
Customized film types can also be created for your applications.

1X Probe