The MP100-ME Thin Film Thickness Measurement system uses multiple gratings in its USB Spectrometer to achieve a wide spectrum range from Visible Wavelength to NIR. Connected directly through the Laptop's USB port this spectrometer is both compact and powerful.

The unique video display design provides the operator with a more ergonomic view of the measurement area, thus eliminating tedious viewing through conventional microscope optics.

​The MP100-ME provides a state-of-the-art function to measure filled cell gap on LCD, Polyimide on ITO, Color Filter CIE Chromaticity, and Color Filter Thickness. MP100-ME is also able to measure Oxide, Nitride, Photoresist and Polysilicon films. The powerful software algorithms can perform multiple layers thickness calculations.
  • Laptop Computer
  • Ocean Optics Spectrometer, Visible to NIR
  • 972RT Metallurgical Microscope
  • Microspot Attachment
  • Wide Wavelength Range Spectrometer
  • Customized Optical Fiber Cables (including UV-VIS Cables)
  • Special Design Microscope Stage
  • Programmable XY Motorized Stage

  • Microspot Attachment
  • Ergonomic View Screen Camera
  • Transmission Measurement
  • Great Value
  • Simple Operation
  • Versatile
  • Expandable
  • High Measurement Repeatability
Scanning Range:
380nm to 950nm

Spectrum Resolution:
2 nm
​
Precision:
0.2 nm
​
Measurement Speed:
2 seconds per Measurement

Measurement Spot Size:
50 microns at 5X Magnification
25 microns at 10X Magnification
12 microns at 20X Magnification
7 microns at 40X Magnification